From measurement to analysis,
all in one place.

We offer FT-IR, XRF, electron microscopy, and other measurement services, along with contract analysis powered by Bayesian inference. From sample measurement and data analysis through report delivery, we accept one-off projects — even for a single sample.

Spectroscopy × Bayesian analysis FT-IR spectrometer with analysis report screen Measurement instrument and sample vials
01Contract Measurement

We handle your measurements, with a focus on spectroscopy.

We support measurements on the instruments below. Just send us your samples — we design the measurement conditions, run them, and organize the data.

Spectroscopy & X-ray AnalysisComposition, chemical state, and structure
Fourier-Transform Infrared Spectrophotometer (FT-IR) JASCO FT/IR-6100

Identification and quantification of organics, resins, and thin films. Wavenumber range 7,800–350 cm⁻¹. Can be combined with our automated spectral analysis for quantitative evaluation.

X-ray Photoelectron Spectrometer (XPS) Shimadzu AXIS-NOVA

Elemental and chemical-state analysis of the outermost surface (a few nm). Depth profiling and elemental mapping are also available.

X-ray Fluorescence Spectrometer (XRF) Philips PW2404

Elemental analysis from B to U. Quantitative analysis is available when you provide reference standards.

Energy-Dispersive XRF Spectrometer (EDXRF) JEOL JSX-1000S

Fast analysis of F–U in solids, powders, liquids, and thin films. Standardless semi-quantitative analysis (Si–U) is available.

Energy-Dispersive X-ray Analysis (SEM-EDS) Oxford Instruments X-MaxN 50

Micro-area elemental analysis (B–U) during electron-microscope observation. Distribution imaging with elemental mapping is also available.

Electron Microscopy & ImagingMicro- and internal-structure observation
Field-Emission Scanning Electron Microscope (FE-SEM) Hitachi High-Tech Regulus8230

Surface observation up to roughly 500,000×. Sample preparation with ion milling and various coaters is also available.

X-ray CT Inspection System Shimadzu Xseeker8000

Non-destructive imaging of internal structure — useful for visualizing cross-sections and finding internal defects.

3D Digital & Polarizing Microscopes HIROX HRX-01 / Leica DM2700P

20–800× observation and 3D measurement. Suited to microstructures of metals, minerals, and FRP.

※ The list above shows representative instruments. Feel free to ask about measurements and tests not listed here.

Talk to us about contract measurement
02Contract Analysis

Analysis-only requests
are welcome too.

We are happy to analyze data you already have — including data taken on other instruments. With our automated spectral-analysis technology and Bayesian inference, you get a well-grounded report covering peak separation and quantification, model selection, and uncertainty evaluation.

Talk to us about contract analysis

How it works

Contact us

Tell us about your problem, samples, data formats, and timeline. NDAs are available.

Proposal & quote

We design the measurement and analysis around your goal, and present the scope and cost.

Measurement & analysis

We measure your samples and analyze the data. Interim progress can be shared.

Report delivery

Results are delivered as a report with supporting evidence, and we walk you through it.

Have samples or data? Let's talk.

Tell us your sample and data formats, deliverables, and timeline — we will propose the best measurement and analysis plan with a quote.

Talk to us about contract analysis